IC200ALG264    模拟量输入模块    

IC695CRU320    CPU 模块 

Rudolph NSX-105 Automated Defect Inspection 
Rudolph S300D Ultra II Thin Film Measurement Tool / Ellipsometer
RUDOLPH S3000A FBE(focused beam laser ellipsometry)
RUDOLPH S3000A FBE(focused beam laser ellipsometry)
RUDOLPH S3000A FBE(focused beam laser ellipsometry)
RUDOLPH S3000A FBE(focused beam laser ellipsometry)
RUDOLPH S3000A FBE(focused beam laser ellipsometry)
RUDOLPH S3000A Focused Beam Ellipsometer
RUDOLPH S3000S FBE(focused beam laser ellipsometry)
RUDOLPH S3000S FBE(focused beam laser ellipsometry)
Rudolph ultra-II Ellipsometer
Rudolph Waferscan 8000 Macro-Defect Inspection System
Rudolph WS3840 3D Bump Metrology
RUDOLPH WV320 Macro Defect Inspection
RUDOLPH AXI_S Macro Inspection System
RUDOLPH AXI_S Macro Inspection System
RUDOLPH AXI_S Macro Inspection System
RUDOLPH META PULSE 200 Surface Film Metrology
RUDOLPH MP200 Film thickness measurement
RUDOLPH MP200 Film thickness measurement
RUDOLPH MP200 Film thickness measurement
RUDOLPH MP200 Film thickness measurement
Rudolph MP200XCU Cu Film thickness measurement
Rudolph MP300 XCu Cu Film thickness measurement
Rudolph MP-300 Metal Film thickness measurement
RUDOLPH WV320 Macro Defect Inspection System
RUDOLPH WV320 Macro Defect Inspection System
Rudolph Research AUTO EL RE-350 Ellipsometer
Rudolph Technologies AUTO EL Ellipsometer
Rudolph Technologies, Inc. Vanguard SpectraLASER 200XL Film Thickness Measurement System
Salon Teknopaja OY PWB Printed Wire Board Level Drop Tester with Solder Joint Reliability tester
SAMCO PD-3800 LED – pecvd system
SAMCO RIE-212 IPC LED Reactive Ion Etcher
SAMCO RIE-300NR Reactive Ion Etching System
SAMCO RIE-300NR Reactive Ion Etching System
Santa Clara Plastics SCP 8500 Wet Wafer Processing System
Santa Clara Plastics SCP 9400 Wet Wafer Processing System
Santa Clara Plastics SCP Custom Wet Wafer Processing System
Santa Clara Plastics SCP Custom Wet Wafer Processing System
Santa Clara Plastics SCP Custom Wet Wafer Processing System
Santa Clara Plastics SCP Custom Wet Wafer Processing System
Santa Clara Plastics SCP Custom Wet Wafer Processing System
Santa Clara Plastics SCP Custom Wet Wafer Processing System
Santa Clara Plastics SCP Custom Wet Wafer Processing System
Santa Clara Plastics SCP E200 Wet Wafer Processing System
Santa Clara Plastics SCP E200 Wet Wafer Processing System
Santa Clara Plastics SCP E200 Wet Wafer Processing System
Schmid Combi Line Spray Cleaner
Scia Systems Magna 200 PVD (Physical Vapor Deb)
SDI Semiconductor Diagnostics 2500 Metrology – Carrier Lifetime Measurement
SECRON IP 300 Prober
Semi-Tool WST 306 MG Spray Solvent Tool 
Semi-Tool WST 406 MG Spray Solvent Tool 
SEMICS OPUS 2 Prober with Ambient and hot (Up to 150 C)
SEMICS OPUS 3 Prober with Ambient and hot (Up to 150 C)
Semilab FAAST 230 Carrier Lifetime measurement System
SEMILAB PMR_3000 Dose Monitoring
SemiNet Automation Infinity SACS 251216-120-CE Semi-Automatic Carousel Boxed Wafer Stocker 
Semitool 870-S Spin Rinse / Dryer (SRD)
Semitool 870-S Spin Rinse / Dryer (SRD)
Semitool 870-S Spin Rinse / Dryer (SRD)
Semitool 870-S Spin Rinse / Dryer (SRD)
Semitool Cintillio SAT Dual Station Acid Spray tool used for Cu, W, dHF
SEMITOOL EO212PM Cu PLTNG
Semitool Raider Tool Suitable for Spares use
Semitool Raider ECD ECD (Electro Chemical Deb)
Semitool Raider ECD ECD (Electro Chemical Deb)
Semitool SAT Wet Wafer Processing System